The IEEE Standards Association (IEEE-SA) will be exhibiting at the NSTI Nanotech 2009 Conference and Expo from 3 – 7 May 2009 at Booth 630.

The conference takes place in Houston, Texas, at the George R. Brown Convention Center.

IEEE has taken the lead in developing nanotechnology-based electronics standards that address materials, devices and system-level interoperability. This activity is part of a broader nanotechnology effort at the IEEE driven by the IEEE Nanotechnology Council (NTC), an interdisciplinary group whose members are drawn from 20 IEEE Societies. For more information about the these activities visit http://standards.ieee.org/announcements/bkgnd_nanostdsinit.html

IEEE-SA Product NEXT will be showcased this year, giving attendees the opportunity to tell the IEEE-SA how our products based on, and including IEEE standards, are being used, how they can be improved, what features or capabilities would be helpful, and what new products would be beneficial in their work environment.  Attendees are encouraged to stop by the booth to fill out a brief survey and for the chance to win a prize from our daily drawing.

Jonathan Tucker, the Standards Committee Chairman of the IEEE Nanotechnology Council, will be available to answer your questions regarding IEEE Nano standards development activities on Tuesday, 5 May, 2009 from 10:00AM to 11:30 AM and from 1:30PM to 3:00PM. Jonathan is also the Co-Chair of the IEEE Nanoelectronics Roadmap Initiative and Vice-Chairman of the IEEE P1690 Standard development program for the characterization of bulk materials enhanced with Carbon Nanotubes. He is also the Senior Marketer for Nanotechnology, Research & Education at Keithley Instruments and is open to answer any questions you may have about electrical measurements in nanotech applications.